%0 Conference Paper %1 conf/irps/IucolanoPRC18 %A Iucolano, Ferdinando %A Parisi, Antonino Maurizio %A Reina, Santo %A Chini, Alessandro %B IRPS %D 2018 %I IEEE %K dblp %P 4-1 %T A novel GaN HEMT degradation mechanism observed during HTST test. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#IucolanoPRC18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/IucolanoPRC18, added-at = {2019-04-08T00:00:00.000+0200}, author = {Iucolano, Ferdinando and Parisi, Antonino Maurizio and Reina, Santo and Chini, Alessandro}, biburl = {https://www.bibsonomy.org/bibtex/2547d76aa72f5cc7487f1e22b1c48692f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353707}, interhash = {a0467c607fef10420a0728edb20a9f48}, intrahash = {547d76aa72f5cc7487f1e22b1c48692f}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = {4-1}, publisher = {IEEE}, timestamp = {2019-10-17T14:45:36.000+0200}, title = {A novel GaN HEMT degradation mechanism observed during HTST test.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#IucolanoPRC18}, year = 2018 }