%0 Journal Article %1 journals/mr/NardiDPBG05 %A Nardi, C. De %A Desplats, Romain %A Perdu, Philippe %A Beaudoin, Felix %A Gauffier, J.-L. %D 2005 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1514-1519 %T Oxide charge measurements in EEPROM devices. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#NardiDPBG05 %V 45

@article{journals/mr/NardiDPBG05, added-at = {2020-02-22T00:00:00.000+0100}, author = {Nardi, C. De and Desplats, Romain and Perdu, Philippe and Beaudoin, Felix and Gauffier, J.-L.}, biburl = {https://www.bibsonomy.org/bibtex/2ebec4ee3e31dce95d6baa65246ed3fcc/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.07.055}, interhash = {acb96c5bac85fee3e2877a71bde79e21}, intrahash = {ebec4ee3e31dce95d6baa65246ed3fcc}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1514-1519}, timestamp = {2020-02-25T13:23:02.000+0100}, title = {Oxide charge measurements in EEPROM devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#NardiDPBG05}, volume = 45, year = 2005 }