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VLSI functional analysis by dynamic emission microscopy., , , and . Microelectron. Reliab., 50 (9-11): 1431-1435 (2010)IR confocal laser microscopy for MEMS Technological Evaluation., , , , and . Microelectron. Reliab., 42 (9-11): 1815-1817 (2002)Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package., , and . Microelectron. Reliab., 49 (9-11): 1169-1174 (2009)Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards., , , , and . Microelectron. Reliab., 46 (9-11): 1569-1574 (2006)Unsupervised learning for signal mapping in dynamic photon emission., , , , , and . Microelectron. Reliab., 55 (9-10): 1564-1568 (2015)Analysis and Compact Modeling of a Vertical Grounded-Base n-p-n Bipolar Transistor Used as ESD Protection in a Smart Power Technology, , , , , , , , and . IEEE J.~Solid~State~Circuits, 36 (9): 1373--1381 (September 2001)Fault Localization using Time Resolved Photon Emission and STIL Waveforms., , , , , and . ITC, page 254-263. IEEE Computer Society, (2003)Frequency mapping in dynamic light emission with wavelet transform., , , , and . Microelectron. Reliab., 53 (9-11): 1387-1392 (2013)Application of various optical techniques for ESD defect localization., , , , , , , , , and . Microelectron. Reliab., 46 (9-11): 1563-1568 (2006)Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications., , , , , , , , and . Microelectron. Reliab., 44 (9-11): 1781-1786 (2004)