%0 Conference Paper %1 conf/indin/SweeneyCK22 %A Sweeney, Terence %A Coleman, Sonya %A Kerr, Dermot %B INDIN %D 2022 %I IEEE %K dblp %P 572-577 %T Deep Learning for Semiconductor Defect Classification. %U http://dblp.uni-trier.de/db/conf/indin/indin2022.html#SweeneyCK22 %@ 978-1-7281-7568-3

@inproceedings{conf/indin/SweeneyCK22, added-at = {2023-01-06T00:00:00.000+0100}, author = {Sweeney, Terence and Coleman, Sonya and Kerr, Dermot}, biburl = {https://www.bibsonomy.org/bibtex/297dc46ba5596442b14b86ba946d3e92f/dblp}, booktitle = {INDIN}, crossref = {conf/indin/2022}, ee = {https://doi.org/10.1109/INDIN51773.2022.9976162}, interhash = {b517eb2c0420d55384fafb41b639b49b}, intrahash = {97dc46ba5596442b14b86ba946d3e92f}, isbn = {978-1-7281-7568-3}, keywords = {dblp}, pages = {572-577}, publisher = {IEEE}, timestamp = {2024-04-10T01:48:06.000+0200}, title = {Deep Learning for Semiconductor Defect Classification.}, url = {http://dblp.uni-trier.de/db/conf/indin/indin2022.html#SweeneyCK22}, year = 2022 }