%0 Conference Paper %1 conf/vts/SinghK93 %A Singh, Adit D. %A Krishna, C. Mani %B VTS %D 1993 %I IEEE Computer Society %K dblp %P 99-105 %T The effect of defect clustering on test transparency and defect levels. %U http://dblp.uni-trier.de/db/conf/vts/vts1993.html#SinghK93 %@ 0-8186-3830-3

@inproceedings{conf/vts/SinghK93, added-at = {2023-03-24T00:00:00.000+0100}, author = {Singh, Adit D. and Krishna, C. Mani}, biburl = {https://www.bibsonomy.org/bibtex/295d638f873209672d19f53357a0bb582/dblp}, booktitle = {VTS}, crossref = {conf/vts/1993}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1993.313301}, interhash = {b6aad2b4e414bfe9715b4aa008543d5d}, intrahash = {95d638f873209672d19f53357a0bb582}, isbn = {0-8186-3830-3}, keywords = {dblp}, pages = {99-105}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:06.000+0200}, title = {The effect of defect clustering on test transparency and defect levels.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1993.html#SinghK93}, year = 1993 }