%0 Journal Article %1 journals/access/YuWBSS22 %A Yu, Sangho %A Won, Sang Min %A Baac, Hyoung Won %A Son, Donghee %A Shin, Changhwan %D 2022 %J IEEE Access %K dblp %P 26340-26346 %T Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection. %U http://dblp.uni-trier.de/db/journals/access/access10.html#YuWBSS22 %V 10

@article{journals/access/YuWBSS22, added-at = {2022-04-01T00:00:00.000+0200}, author = {Yu, Sangho and Won, Sang Min and Baac, Hyoung Won and Son, Donghee and Shin, Changhwan}, biburl = {https://www.bibsonomy.org/bibtex/2cdb39403dc14dfc8dc6307ce82b8182c/dblp}, ee = {https://doi.org/10.1109/ACCESS.2022.3156118}, interhash = {b6ea181f1ada8dc92bf985ed01813e20}, intrahash = {cdb39403dc14dfc8dc6307ce82b8182c}, journal = {IEEE Access}, keywords = {dblp}, pages = {26340-26346}, timestamp = {2024-04-08T14:05:25.000+0200}, title = {Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection.}, url = {http://dblp.uni-trier.de/db/journals/access/access10.html#YuWBSS22}, volume = 10, year = 2022 }