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Disambiguation of "Son, Donghee"

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Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection.

, , , , and . IEEE Access, (2022)

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Donghee Kang

Misuk Son

Sertaç Son

Giok Son

Son Tran

 

Other publications of authors with the same name

Fractal Residual Network and Solutions for Real Super-Resolution., and . CVPR Workshops, page 2114-2121. Computer Vision Foundation / IEEE, (2019)Towards the Development of Bidirectional Peripheral Nerve Interface for Long-term Implantation., , , , , , , and . CBS, page 181-184. IEEE, (2018)Quantitative Evaluation of Line-Edge Roughness in Various FinFET Structures: Bayesian Neural Network With Automatic Model Selection., , , , and . IEEE Access, (2022)Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs., , , , , , and . Microelectron. Reliab., 53 (9-11): 1351-1354 (2013)Degradation of pMOSFETs due to hot electron induced punchthrough., , , , , and . Microelectron. Reliab., (2016)Unified Cox model based multifactor dimensionality reduction method for gene-gene interaction analysis of the survival phenotype., , , , and . BioData Min., 11 (1): 27:1-27:13 (2018)Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM., , , , , and . IRPS, page 1-4. IEEE, (2021)NTIRE 2019 Challenge on Real Image Super-Resolution: Methods and Results., , , , , , , , , and 94 other author(s). CVPR Workshops, page 2211-2223. Computer Vision Foundation / IEEE, (2019)Noise Conditional Flow Model for Learning the Super-Resolution Space., and . CVPR Workshops, page 424-432. Computer Vision Foundation / IEEE, (2021)Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM., , , , and . IRPS, page 1-4. IEEE, (2019)