%0 Conference Paper %1 conf/vts/NienLWWWC23 %A Nien, Yu-Teng %A Li, Chen-Hong %A Wu, Pei-Yin %A Wang, Yung-Jheng %A Wu, Kai-Chiang %A Chao, Mango C.-T. %B VTS %D 2023 %I IEEE %K dblp %P 1-7 %T Test Generation for Defect-Based Faults of Scan Flip-Flops. %U http://dblp.uni-trier.de/db/conf/vts/vts2023.html#NienLWWWC23 %@ 979-8-3503-4630-5

@inproceedings{conf/vts/NienLWWWC23, added-at = {2023-06-09T00:00:00.000+0200}, author = {Nien, Yu-Teng and Li, Chen-Hong and Wu, Pei-Yin and Wang, Yung-Jheng and Wu, Kai-Chiang and Chao, Mango C.-T.}, biburl = {https://www.bibsonomy.org/bibtex/270a904be358b4799f1c91bbc603856bd/dblp}, booktitle = {VTS}, crossref = {conf/vts/2023}, ee = {https://doi.org/10.1109/VTS56346.2023.10140039}, interhash = {bf0ae994a53aab43436127771b0a0150}, intrahash = {70a904be358b4799f1c91bbc603856bd}, isbn = {979-8-3503-4630-5}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-04-09T23:55:35.000+0200}, title = {Test Generation for Defect-Based Faults of Scan Flip-Flops.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2023.html#NienLWWWC23}, year = 2023 }