%0 Conference Paper %1 conf/irps/TheodorouIHPJDG15 %A Theodorou, Christoforos G. %A Ioannidis, Eleftherios G. %A Haendler, Sébastien %A Planes, Nicolas %A Josse, Emmanuel %A Dimitriadis, Charalambos A. %A Ghibaudo, Gérard %B IRPS %D 2015 %I IEEE %K dblp %P 1 %T New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TheodorouIHPJDG15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/TheodorouIHPJDG15, added-at = {2023-09-30T00:00:00.000+0200}, author = {Theodorou, Christoforos G. and Ioannidis, Eleftherios G. and Haendler, Sébastien and Planes, Nicolas and Josse, Emmanuel and Dimitriadis, Charalambos A. and Ghibaudo, Gérard}, biburl = {https://www.bibsonomy.org/bibtex/23bee120ed63e99c00f0a73f16d0bfb6b/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112833}, interhash = {c54d746bf1b99249dd2ebcb3db2c38ac}, intrahash = {3bee120ed63e99c00f0a73f16d0bfb6b}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 1, publisher = {IEEE}, timestamp = {2024-04-10T16:54:51.000+0200}, title = {New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TheodorouIHPJDG15}, year = 2015 }