%0 Journal Article %1 journals/ieicet/KomatsuAI06 %A Komatsu, Yoshihide %A Arima, Yukio %A Ishibashi, Koichiro %D 2006 %J IEICE Trans. Electron. %K dblp %N 3 %P 384-391 %T Soft Error Hardened Latch Scheme with Forward Body Bias in a 90-nm Technology and Beyond. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet89c.html#KomatsuAI06 %V 89-C

@article{journals/ieicet/KomatsuAI06, added-at = {2020-04-11T00:00:00.000+0200}, author = {Komatsu, Yoshihide and Arima, Yukio and Ishibashi, Koichiro}, biburl = {https://www.bibsonomy.org/bibtex/2aeede487515b60a0a7d3d6f3d154e5bb/dblp}, ee = {https://doi.org/10.1093/ietele/e89-c.3.384}, interhash = {c852adb62fb8d3ebdc263b73c04a8528}, intrahash = {aeede487515b60a0a7d3d6f3d154e5bb}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 3, pages = {384-391}, timestamp = {2020-04-14T11:58:36.000+0200}, title = {Soft Error Hardened Latch Scheme with Forward Body Bias in a 90-nm Technology and Beyond.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet89c.html#KomatsuAI06}, volume = {89-C}, year = 2006 }