%0 Conference Paper %1 conf/iccad/RaviDP07 %A Ravi, Srivaths %A Devanathan, V. R. %A Parekhji, Rubin A. %B ICCAD %D 2007 %E Gielen, Georges G. E. %I IEEE Computer Society %K dblp %P 526-529 %T Methodology for low power test pattern generation using activity threshold control logic. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2007.html#RaviDP07 %@ 1-4244-1382-6

@inproceedings{conf/iccad/RaviDP07, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ravi, Srivaths and Devanathan, V. R. and Parekhji, Rubin A.}, biburl = {https://www.bibsonomy.org/bibtex/2ce03c44f37dc5b32232b11b04c37e26e/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2007}, editor = {Gielen, Georges G. E.}, ee = {https://dl.acm.org/citation.cfm?id=1326181}, interhash = {dde2f6e33a502778009eed0eac24a5e6}, intrahash = {ce03c44f37dc5b32232b11b04c37e26e}, isbn = {1-4244-1382-6}, keywords = {dblp}, pages = {526-529}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T17:54:27.000+0200}, title = {Methodology for low power test pattern generation using activity threshold control logic.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2007.html#RaviDP07}, year = 2007 }