%0 Journal Article %1 journals/mr/StathisLRL03 %A Stathis, James H. %A Linder, Barry P. %A Rodríguez, Rosana %A Lombardo, Salvatore %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1353-1360 %T Reliability of ultra-thin oxides in CMOS circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#StathisLRL03 %V 43

@article{journals/mr/StathisLRL03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Stathis, James H. and Linder, Barry P. and Rodríguez, Rosana and Lombardo, Salvatore}, biburl = {https://www.bibsonomy.org/bibtex/24f46f0724c617105460c516d39adeb3f/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00242-7}, interhash = {de813b51160ff8d42401355eb654f219}, intrahash = {4f46f0724c617105460c516d39adeb3f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1353-1360}, timestamp = {2020-02-25T13:25:44.000+0100}, title = {Reliability of ultra-thin oxides in CMOS circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#StathisLRL03}, volume = 43, year = 2003 }