%0 Conference Paper %1 conf/dac/ChickermaneRBP93 %A Chickermane, Vivek %A Rudnick, Elizabeth M. %A Banerjee, Prithviraj %A Patel, Janak H. %B DAC %D 1993 %E Dunlop, Alfred E. %I ACM Press %K dblp %P 236-241 %T Non-Scan Design-for-Testability Techniques for Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/dac/dac93.html#ChickermaneRBP93 %@ 0-89791-577-1

@inproceedings{conf/dac/ChickermaneRBP93, added-at = {2017-03-16T00:00:00.000+0100}, author = {Chickermane, Vivek and Rudnick, Elizabeth M. and Banerjee, Prithviraj and Patel, Janak H.}, biburl = {https://www.bibsonomy.org/bibtex/2fef72de0a633c917a2c92e0419e9da77/dblp}, booktitle = {DAC}, crossref = {conf/dac/1993}, editor = {Dunlop, Alfred E.}, ee = {http://doi.acm.org/10.1145/157485.164686}, interhash = {ea046c25cc642f0501d30dbf3cb0ae35}, intrahash = {fef72de0a633c917a2c92e0419e9da77}, isbn = {0-89791-577-1}, keywords = {dblp}, pages = {236-241}, publisher = {ACM Press}, timestamp = {2017-03-17T11:41:30.000+0100}, title = {Non-Scan Design-for-Testability Techniques for Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac93.html#ChickermaneRBP93}, year = 1993 }