%0 Conference Paper %1 conf/aspdac/HuangSKCT16 %A Huang, Xin %A Sukharev, Valeriy %A Kim, Taeyoung %A Chen, Hai-Bao %A Tan, Sheldon X.-D. %B ASP-DAC %D 2016 %I IEEE %K dblp %P 244-249 %T Electromigration recovery modeling and analysis under time-dependent current and temperature stressing. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2016.html#HuangSKCT16 %@ 978-1-4673-9569-4

@inproceedings{conf/aspdac/HuangSKCT16, added-at = {2019-06-02T00:00:00.000+0200}, author = {Huang, Xin and Sukharev, Valeriy and Kim, Taeyoung and Chen, Hai-Bao and Tan, Sheldon X.-D.}, biburl = {https://www.bibsonomy.org/bibtex/219af0337b366470aa01710012e676a45/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2016}, ee = {https://www.wikidata.org/entity/Q60154746}, interhash = {f64ce804694fe58b79c04189050eb834}, intrahash = {19af0337b366470aa01710012e676a45}, isbn = {978-1-4673-9569-4}, keywords = {dblp}, pages = {244-249}, publisher = {IEEE}, timestamp = {2019-10-17T16:46:00.000+0200}, title = {Electromigration recovery modeling and analysis under time-dependent current and temperature stressing.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2016.html#HuangSKCT16}, year = 2016 }