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Disambiguation of "Sukharev, Valeriy"

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Electromigration recovery modeling and analysis under time-dependent current and temperature stressing.

, , , , and . ASP-DAC, page 244-249. IEEE, (2016)

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Valeriy Golyk

Valeriy Vorontsov

 

Other publications of authors with the same name

Lifetime optimization for real-time embedded systems considering electromigration effects., , , , , and . ICCAD, page 434-439. IEEE, (2014)Power Grid Fixing for Electromigration-induced Voltage Failures., , and . ICCAD, page 1-8. ACM, (2019)Physics-based Electromigration Assessment for Power Grid Networks., , , and . DAC, page 80:1-80:6. ACM, (2014)Electromigration Checking Using a Stochastic Effective Current Model., , and . ICCAD, page 5:1-5:8. IEEE, (2020)Control of design specific variation in etch-assisted via pattern transfer by means of full-chip simulation., , , , , , , , , and 1 other author(s). ISQED, page 156-161. IEEE Computer Society, (2009)Closed-form modeling of layout-dependent mechanical stress., , , , , and . DAC, page 673-678. ACM, (2010)A Unified Physics-Based Stochastic Model for EM-Induced Resistance Degradation in BEoL Interconnect Segments., , , , , and . IRPS, page 1-10. IEEE, (2024)Assesment of CPI Stress Impact on IC Reliability and Performance in 2.5D/3D Packages., , , and . IRPS, page 1-7. IEEE, (2019)Novel Methodology for Assessing Chip-Package Interaction Effects onChip Performance., , , , , , , , , and 6 other author(s). ISPD, page 83-89. ACM, (2022)Learning-based dynamic reliability management for dark silicon processor considering EM effects., , , , and . DATE, page 463-468. IEEE, (2016)