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MEGL: Multi-Experts Guided Learning Network for Single Camera Training Person Re-Identification., , , , , , и . ICIP, стр. 2645-2649. IEEE, (2023)Efficient Compression Methods for Wire-Spread-Based Stochastic Computing Deep Neural Networks., , , и . IEEE Trans. Circuits Syst. II Express Briefs, 69 (11): 4538-4542 (2022)Fusion of SVMs in wavelet domain for hyperspectral data classification., , и . ROBIO, стр. 1372-1375. IEEE, (2009)A Multiple Conditional Random Fields Ensemble Model for Urban Area Detection in Remote Sensing Optical Images., и . IEEE Trans. Geosci. Remote. Sens., 45 (12-1): 3978-3988 (2007)Fast extraction of ellipses., , и . ICPR, стр. 508-510. IEEE, (1988)A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs., , , , , , , , , и 3 other автор(ы). IRPS, стр. 1-5. IEEE, (2020)New-Generation Design-Technology Co-Optimization (DTCO): Machine-Learning Assisted Modeling Framework., , , , , , , , и . CoRR, (2019)Challenges of 22 nm and beyond CMOS technology., , , , , , , , , и 1 other автор(ы). Sci. China Ser. F Inf. Sci., 52 (9): 1491-1533 (2009)SCGen: A Versatile Generator Framework for Agile Design of Stochastic Circuits., , , , , и . DATE, стр. 1-6. IEEE, (2024)Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life., , и . ICICDT, стр. 1-3. IEEE, (2016)