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Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET., , , , , , , , , and 6 other author(s). IRPS, page 1-5. IEEE, (2020)Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM., , , , , , , , , and 4 other author(s). IRPS, page 1-4. IEEE, (2020)CPI reliability and EMI benefit for MIM CAP embedded C4 package., , , , , , , and . IRPS, page 5. IEEE, (2015)Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology., , , , , , and . IRPS, page 1-6. IEEE, (2024)Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence., , , , , , and . IRPS, page 1-5. IEEE, (2024)Two-Dimensional Position Detection System with MEMS Accelerometer for MOUSE Applications., , , , and . DAC, page 852-857. ACM, (2001)The preferred type of tone-curve in a transparent OLED display., , , , and . CIC, page 290-293. Society for Imaging Science and Technology, (2018)Reliability of Industrial grade Embedded-STT-MRAM., , , , , , , , , and 21 other author(s). IRPS, page 1-3. IEEE, (2020)On the Filter Size of DMM for Passive Scalar in Complex Flow., , and . FSKD (1), volume 3613 of Lecture Notes in Computer Science, page 1127-1132. Springer, (2005)Series-resonant VHF micromechanical resonator reference oscillators., , , , , and . IEEE J. Solid State Circuits, 39 (12): 2477-2491 (2004)