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Guest Editorial., , and . J. Electron. Test., 11 (1): 7-8 (1997)Finite state machine synthesis with embedded test function., and . J. Electron. Test., 1 (3): 221-228 (1990)Test-Quality Optimization for Variable $n$ -Detections of Transition Faults., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (8): 1738-1749 (2014)A Simulation-Based Method for Generating Tests for Sequential Circuits., , and . IEEE Trans. Computers, 39 (12): 1456-1463 (1990)STOIC: state assignment based on output/input functions., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (8): 1123-1131 (1993)Perturb and simplify: multilevel Boolean network optimizer., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (12): 1494-1504 (1996)PBIR: perception-based image retrieval-a system that can quickly capture subjective image query concepts., , , , , and . ACM Multimedia, page 611-614. ACM, (2001)Bidirectional tuning of microring-based silicon photonic transceivers for optimal energy efficiency., , , , , and . ASP-DAC, page 370-375. ACM, (2019)Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies., , , and . ITC, page 339-348. IEEE Computer Society, (2003)The Confluence of Manufacturing Test and Design Validation.. ITC, page 1293. IEEE Computer Society, (2003)