( en | de | ru )

 

Disambiguation of "Castillo, Ivan"

Author of the publication

copydeleteadd this publication to your clipboard
Continuous assessment of data sources quality for improving the resilience of multisource fusion platforms.

, , , , , , , and . ACC, page 4323-4328. IEEE, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mayarí Castillo

Katty Castillo

Roderick Castillo

Katty Castillo

Sarah Ivanovas

 

Other publications of authors with the same name

Integration of process knowledge and statistical learning for the Dow data challenge problem., , , , , , and . Comput. Chem. Eng., (2021)Recent trends on hybrid modeling for Industry 4.0., , , , , , and . Comput. Chem. Eng., (2021)Plant-model mismatch estimation in unconstrained state-space MPC., , , , , , and . ACC, page 3078-3083. IEEE, (2017)Using a distributed control system (DCS) for distillation column control in an undergraduate unit operations laboratory., and . ACC, page 2744-2748. IEEE, (2009)Plant-model mismatch evaluation for unconstrained MPC with state estimation., , , , , , and . CDC, page 6177-6182. IEEE, (2017)Detection of Valve Stiction in Industrial Control Loops through Continuous Wavelet Transformation With a CNN*., , , , , , and . ACC, page 1512-1517. IEEE, (2024)Continuous assessment of data sources quality for improving the resilience of multisource fusion platforms., , , , , , , and . ACC, page 4323-4328. IEEE, (2022)Robust nonlinear fault detection applied to chemical processes., , and . ACC, page 3623-3628. IEEE, (2010)Digital Hand Tracking. Interacción sin contacto para la manipulación de imágenes diagnósticas en el quirófano., , , , and . CLIHC, page 8:1-8:4. ACM, (2021)Data-driven plant-model mismatch quantification for MIMO MPC systems with feedforward control path., , , , , , and . ACC, page 2760-2765. IEEE, (2020)