( en | de | ru )

 

Disambiguation of "Jain, Jawahar"

Author of the publication

copydeleteadd this publication to your clipboard
Can SAT be used to Improve Sequential ATPG Methods?

, , and . VLSI Design, page 585-. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Gora Jain

Arpit Jain

Himalaya Jain

Tushar Jain

Prabhat Jain

 

Other publications of authors with the same name

Comparing stress markers across various cohorts in a mobile setting., , , and . EMBC, page 7274-7277. IEEE, (2013)Verification of Industrial Designs Using A Computing Grid With More than 100 Nodes., , , and . Asian Test Symposium, page 460. IEEE Computer Society, (2005)Functional learning: a new approach to learning in digital circuits., , and . VTS, page 122-127. IEEE Computer Society, (1994)Probabilistic Design Verification., , , and . ICCAD, page 468-471. IEEE Computer Society, (1991)Reachability analysis using partitioned-ROBDDs., , , , and . ICCAD, page 388-393. IEEE Computer Society / ACM, (1997)Testing, Verification, and Diagnosis in the Presence of Unknowns., , , , , and . VTS, page 263-270. IEEE Computer Society, (2000)An Efficient Filter-Based Approach for Combinational Verification., , , , , and . DATE, page 132-137. IEEE Computer Society / ACM, (1999)Multiple Error Diagnosis Based on Xlists., , , , and . DAC, page 660-665. ACM Press, (1999)Dynamically resizable binary decision diagrams., and . ACM Great Lakes Symposium on VLSI, page 185-190. ACM, (2010)Optimizing BDDs for time-series dataset manipulation., and . DATE, page 1018-1021. EDA Consortium San Jose, CA, USA / ACM DL, (2013)