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Recursive Pseudo-Exhaustive Two-Pattern Generation., , и . IEEE Trans. Very Large Scale Integr. Syst., 18 (1): 142-152 (2010)Testability Analysis and Scalable Test Generation for High-Speed Floating-Point Units., , , и . IEEE Trans. Computers, 55 (11): 1449-1457 (2006)Anatomy of On-Chip Memory Hardware Fault Effects Across the Layers., и . IEEE Trans. Emerg. Top. Comput., 11 (2): 420-431 (апреля 2023)The functional and performance tolerance of GPUs to permanent faults in registers., , и . IOLTS, стр. 236-239. IEEE, (2013)Measuring the performance impact of permanent faults in modern microprocessor architectures., , , и . IOLTS, стр. 181-184. IEEE, (2013)Hierarchical synthesis of quantum and reversible architectures., и . Conf. Computing Frontiers, стр. 13:1-13:8. ACM, (2015)Bayesian network early reliability evaluation analysis for both permanent and transient faults., , , , , , , и . IOLTS, стр. 7-12. IEEE, (2015)Dependable Multicore Architectures at Nanoscale: The View From Europe., , , , , , , , , и 4 other автор(ы). IEEE Des. Test, 32 (2): 17-28 (2015)Energy Efficiency of Out-of-Order CPUs: Comparative Study and Microarchitectural Hotspot Characterization of RISC-V Designs., , , и . IISWC, стр. 216-220. IEEE, (2023)Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures., , и . ITC, стр. 377-382. IEEE, (2023)