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Schnelle Rasterkraftmikroskopie durch moderne Regelungstechnik und mechatronische Systemintegration.

, , , и . Elektrotech. Informationstechnik, 129 (1): 28-33 (2012)

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Peter Schitter

Hans Günter Schitter

Hans Günter Schitter

Hans Günter Schitter

Jens Georg

 

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