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Solar Cell Analysis with Light Emission and OBIC Techniques., , , , , и . Microelectron. Reliab., 43 (9-11): 1755-1760 (2003)Impact of Technology Spreading on MEMS design Robustness., , , , , , и . VLSI-SOC, том 218 из IFIP Conference Proceedings, стр. 241-251. Kluwer, (2001)