( en | de | ru )

 

Disambiguation of "Maeda, Kazuki"

Author of the publication

copydeleteadd this publication to your clipboard
Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM.

, , , and . ESSDERC, page 46-49. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ryozo Maeda

Daniel Maeda

Aoi Maeda

Shinji Maeda

 

Other publications of authors with the same name

Energy Management System of Houses and Apartments With Electric Vehicles., and . CE, page 73-84. Springer, (2012)MFC: An open-source high-order multi-component, multi-phase, and multi-scale compressible flow solver, , , , , and . (2019)cite arxiv:1907.10512Comment: 25 pages, 8 figures, 2 tables. Submitted to Computer Physics Communications.Theory of Discrete and Ultradiscrete Integrable Finite Lattices Associated with Orthogonal Polynomials and Its Applications.. Kyoto University, Japan, (2014)A large scale simulation of excitation propagation in layer 2/3 of primary and secondary visual cortices of mice., , , , , and . EMBC, page 3957-3960. IEEE, (2015)Data-Aware Partial ECC with Data Modulation of ReRAM with Non-volatile In-memory Computing for Image Recognition with Deep Neural Network., , , , and . ISCAS, page 1-5. IEEE, (2018)Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM., , , and . ESSDERC, page 46-49. IEEE, (2018)Initial Sizing Model of PV/battery System with Battery Scheduling Algorithm., , and . CE, page 141-148. Springer, (2011)An Optimization Method for Designing Ecological and Economical Procurement Logistics System., , and . CE, page 63-71. Springer, (2012)Eulerian-Lagrangian method for simulation of cloud cavitation., and . J. Comput. Phys., (2018)Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM., , , , and . IRPS, page 4-1. IEEE, (2018)