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Design of high-performance band-pass sigma-delta modulator with concurrent error detection., , , и . ICECS, стр. 1202-1205. IEEE, (1996)Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST., , и . SBCCI, стр. 105-110. ACM, (2004)Designing a Radiation Hardened 8051-Like Micro-Controller., , , , , , и . SBCCI, стр. 255-262. IEEE Computer Society, (2000)Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy., , , и . European Test Symposium, стр. 261. IEEE Computer Society, (2010)Test and Design-for-Test of Mixed-Signal Integrated Circuits., и . IFIP Congress Tutorials, том 157 из IFIP, стр. 183-212. Kluwer/Springer, (2004)Designing Testable Networks for Transfer Function Realization., , , и . LATW, стр. 84-87. IEEE, (2001)The Use of Macromodels on Op-Amp Circuits Fault Modeling., , и . LATW, стр. 188-192. IEEE, (2000)Filter Sensitivity Analysis Using the TRAM., , , и . LATW, стр. 80-83. IEEE, (2001)Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors., , , , и . LATW, стр. 1-6. IEEE, (2009)Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order., , , и . LATW, стр. 83-85. IEEE, (2002)