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Ramulator 2.0: A Modern, Modular, and Extensible DRAM Simulator.

H. Luo, Y. Tugrul, F. Bostanci, A. Olgun, A. Yaglikçi, и O. Mutlu. IEEE Comput. Archit. Lett., 23 (1): 112-116 (января 2024)

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Tugrul Türkmenoglu

Levent Tugrul

Tugrul Ince

Tugrul Kocak

Hala Yahya Abdullah Barsoom

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Understanding Read Disturbance in High Bandwidth Memory: An Experimental Analysis of Real HBM2 DRAM Chips.A. Olgun, M. Osseiran, A. Yaglikçi, Y. Tugrul, H. Luo, S. Rhyner, B. Salami, J. Gómez-Luna, и O. Mutlu. CoRR, (2023)ABACuS: All-Bank Activation Counters for Scalable and Low Overhead RowHammer Mitigation.A. Olgun, Y. Tugrul, N. Bostanci, I. Yuksel, H. Luo, S. Rhyner, A. Yaglikçi, G. Oliveira, и O. Mutlu. CoRR, (2023)CoMeT: Count-Min-Sketch-based Row Tracking to Mitigate RowHammer at Low Cost.F. Bostanci, I. Yüksel, A. Olgun, K. Kanellopoulos, Y. Tugrul, A. Yaglikçi, M. Sadrosadati, и O. Mutlu. HPCA, стр. 593-612. IEEE, (2024)Spatial Variation-Aware Read Disturbance Defenses: Experimental Analysis of Real DRAM Chips and Implications on Future Solutions.A. Yaglikçi, Y. Tugrul, G. Oliveira, I. Yüksel, A. Olgun, H. Luo, и O. Mutlu. HPCA, стр. 560-577. IEEE, (2024)Simultaneous Many-Row Activation in Off-the-Shelf DRAM Chips: Experimental Characterization and Analysis.I. Yüksel, Y. Tugrul, F. Bostanci, G. Oliveira, A. Yaglikçi, A. Olgun, M. Soysal, H. Luo, J. Gómez-Luna, M. Sadrosadati и 1 other автор(ы). DSN, стр. 99-114. IEEE, (2024)RowPress Vulnerability in Modern DRAM Chips.H. Luo, A. Olgun, A. Yaglikçi, Y. Tugrul, S. Rhyner, M. Cavlak, J. Lindegger, M. Sadrosadati, и O. Mutlu. IEEE Micro, 44 (4): 60-69 (июля 2024)Ramulator 2.0: A Modern, Modular, and Extensible DRAM Simulator.H. Luo, Y. Tugrul, F. Bostanci, A. Olgun, A. Yaglikçi, и O. Mutlu. IEEE Comput. Archit. Lett., 23 (1): 112-116 (января 2024)Uncovering In-DRAM RowHammer Protection Mechanisms: A New Methodology, Custom RowHammer Patterns, and Implications.H. Hassan, Y. Tugrul, J. Kim, V. van der Veen, K. Razavi, и O. Mutlu. MICRO, стр. 1198-1213. ACM, (2021)Read Disturbance in High Bandwidth Memory: A Detailed Experimental Study on HBM2 DRAM Chips.A. Olgun, M. Osseiran, A. Yaglikçi, Y. Tugrul, H. Luo, S. Rhyner, B. Salami, J. Gómez-Luna, и O. Mutlu. DSN, стр. 75-89. IEEE, (2024)RowPress: Amplifying Read Disturbance in Modern DRAM Chips.H. Luo, A. Olgun, A. Yaglikçi, Y. Tugrul, S. Rhyner, M. Cavlak, J. Lindegger, M. Sadrosadati, и O. Mutlu. ISCA, стр. 28:1-28:18. ACM, (2023)

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