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Trace Driven Simulation using Sampled Traces.

, and . HICSS (1), page 211-220. IEEE Computer Society, (1994)

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A Fast and Accurate Gate-Level Transient Fault Simulation Environment., , , , and . FTCS, page 310-319. IEEE Computer Society, (1993)Partial Scan Design Based on Circuit State Information., , , and . DAC, page 807-812. ACM Press, (1996)Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists., , , , , and . DAC, page 133-138. ACM Press, (1995)Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator., , and . DAC, page 535-540. IEEE Computer Society Press, (1990)APT: An Area-Performance-Testability Driven Placement Algorithm., , , and . DAC, page 141-146. IEEE Computer Society Press, (1992)Sequential Circuit Test Generation in a Genetic Algorithm Framework., , , and . DAC, page 698-704. ACM Press, (1994)Efficient Variable Ordering Heuristics for Shared ROBDD., , and . ISCAS, page 1690-1693. IEEE, (1993)A Gate-Level Simulation Environment for Alpha-Particle-Induced Transient Faults., , , , and . IEEE Trans. Computers, 45 (11): 1248-1256 (1996)A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders., and . IEEE Trans. Computers, 36 (7): 891-895 (1987)Partial Scan Design Based on Circuit State Information and Functional Analysis., and . IEEE Trans. Computers, 53 (3): 276-287 (2004)