( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Intra-Cell Defects Diagnosis.

, , , , , , и . J. Electron. Test., 30 (5): 541-555 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Luigi Sportelli

Luigi Busarello

Luigi Nardi

Luigi Monni

Luigi Poisson

 

Другие публикации лиц с тем же именем

Effect-cause intra-cell diagnosis at transistor level., , , , , , и . ISQED, стр. 460-467. IEEE, (2013)A calculation method to estimate single event upset cross section., , , , , и . Microelectron. Reliab., (2017)Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells., , , и . DTIS, стр. 1-5. IEEE, (2018)A study of path delay variations in the presence of uncorrelated power and ground supply noise., , , , , и . DDECS, стр. 189-194. IEEE Computer Society, (2011)On using a SPICE-like TSTAC™ eFlash model for design and test., , , , , , , , и . DDECS, стр. 359-364. IEEE Computer Society, (2011)Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling., , , , , , и . DDECS, стр. 353-358. IEEE Computer Society, (2011)A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems., , , , и . DTIS, стр. 1-5. IEEE, (2020)An effective ATPG flow for Gate Delay Faults., , , , , и . DTIS, стр. 1-6. IEEE, (2015)Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution., , , , , и . Asian Test Symposium, стр. 266-271. IEEE Computer Society, (2004)Delay Fault Diagnosis in Sequential Circuits., , , , , , и . Asian Test Symposium, стр. 355-360. IEEE Computer Society, (2009)