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Analysis of Tripping Fault of 2213 Outgoing Line Interval Circuit Breaker in a Certain Substation.

Y. Han, G. Liu, Q. Fang, Q. Zhao, N. Li, and J. He. ICITEE, page 243-250. ACM, (2023)

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Hong Jin

Li Jin

Hua Jing

Xiufang Jin

Depu Jin

Other publications of authors with the same name

Hyaluronic acid-based scaffold for central neural tissue engineeringX. Wang, J. He, Y. Wang, and F. Cui. Interface Focus, 2 (3): 278--291 (2012)Acceleration of LSTM With Structured Pruning Method on FPGA.S. Wang, P. Lin, R. Hu, H. Wang, J. He, Q. Huang, and S. Chang. IEEE Access, (2019)High-Speed Data Channel in the Disk Array System.H. Jin, J. He, D. Feng, and J. Zhang. SYBEN, volume 3408 of SPIE Proceedings, page 580-591. SPIE, (1998)Tunable Surface-Plasmon-Polariton Filter Constructed By Corrugated Metallic Line and High Permittivity Material.J. Luo, J. He, A. Apriyana, G. Feng, Q. Huang, and Y. Zhang. IEEE Access, (2018)面向燃气调压应用的RBF人工智能控制策略 (RBF Artificial Intelligence Control Strategy for Gas Pressure Regulating Application).J. He, Y. Zhong, L. Sun, and X. Zhang. 计算机科学, 46 (6A): 138-141 (2019)Targeted aspects oriented topic modeling for short texts.J. He, L. Li, Y. Wang, and X. Wu. Appl. Intell., 50 (8): 2384-2399 (2020)Hierarchical features-based targeted aspect extraction from online reviews.J. He, L. Li, Y. Wang, and X. Wu. Intell. Data Anal., 25 (1): 205-223 (2021)A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection.C. Ma, L. Zhang, C. Zhang, X. Zhang, J. He, and X. Zhang. Microelectron. Reliab., 51 (2): 337-341 (2011)Development and evaluations of an approach with full utilization of point cloud for measuring the angle of repose.Z. Wu, H. Li, C. Lu, J. He, Q. Wang, D. Liu, D. Cui, R. Li, Q. Wang, and D. He. Comput. Electron. Agric., (June 2023)Experimental research on a propeller blade fertilizer transport device based on a discrete element fertilizer block model.G. Chen, Q. Wang, H. Li, J. He, C. Lu, D. Xu, and M. Sun. Comput. Electron. Agric., (May 2023)

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Disambiguation of "He, Jin"

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Analysis of Tripping Fault of 2213 Outgoing Line Interval Circuit Breaker in a Certain Substation.

Please choose a person to relate this publication to

Hong Jin

Li Jin

Hua Jing

Xiufang Jin

Depu Jin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "He, Jin"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Analysis of Tripping Fault of 2213 Outgoing Line Interval Circuit Breaker in a Certain Substation.

Please choose a person to relate this publication to

Hong Jin

Li Jin

Hua Jing

Xiufang Jin

Depu Jin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Analysis of Tripping Fault of 2213 Outgoing Line Interval Circuit Breaker in a Certain Substation.