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Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times., , , , , и . ITC, стр. 1-7. IEEE, (2015)Spiking Neuron Hardware-Level Fault Modeling., , , , , , и . IOLTS, стр. 1-4. IEEE, (2020)Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes., , , , , , , , , и 7 other автор(ы). MWSCAS, стр. 1081-1084. IEEE, (2014)Concurrent Error Detection in Linear Analog Circuits Using State Estimation., и . ITC, стр. 1164-1173. IEEE Computer Society, (2003)Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST., , , и . VLSI-SoC (Selected Papers), том 464 из IFIP Advances in Information and Communication Technology, стр. 129-148. Springer, (2014)Fast deployment of alternate analog test using Bayesian model fusion., , , , , и . DATE, стр. 1030-1035. ACM, (2015)Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors., , , , , и . ISVLSI, стр. 627. IEEE Computer Society, (2015)Harnessing fabrication process signature for predicting yield across designs., , , , , и . ISCAS, стр. 898-901. IEEE, (2016)Special session 4C: Thesis research poster session.. VTS, стр. 131. IEEE Computer Society, (2010)Defect Filter for Alternate RF Test., , , и . ETS, стр. 101-106. IEEE Computer Society, (2009)