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Disambiguation of "Weckx, Pieter"

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Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm.

, , , , , and . IRPS, page 1-7. IEEE, (2021)

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Pieter Wolter

Pieter Zwieten

Pieter Ploumen

Pieter Dingeldey

Pieter Steenhuis

 

Other publications of authors with the same name

Backside PDN and 2.5D MIMCAP to Double Boost 2D and 3D ICs IR-Drop beyond 2nm Node., , , , , , , , , and 7 other author(s). VLSI Technology and Circuits, page 429-430. IEEE, (2022)Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies., , , , , , , , , and 10 other author(s). IRPS, page 1-6. IEEE, (2021)The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)., , , , , , , , , and 6 other author(s). IRPS, page 1-7. IEEE, (2023)On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs., , , and . LATW, page 1-4. IEEE, (2014)Design of a 150 mV Supply, 2 MIPS, 90nm CMOS, Ultra-Low-Power Microprocessor., , , and . PATMOS, volume 7606 of Lecture Notes in Computer Science, page 175-184. Springer, (2012)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , and 5 other author(s). Microprocess. Microsystems, 39 (8): 1039-1051 (2015)Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (3): 601-610 (2019)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)