( en | de | ru )

 

Disambiguation of "Ji, Zhigang"

Author of the publication

copydeleteadd this publication to your clipboard
Physics-Informed Learning for EPG-Based TDDB Assessment.

, , , , , and . ASPDAC, page 651-656. IEEE, (2024)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Zhigang Shen

Zhigang Zhang

Zhigang Zhang

Zhigang Zhang

Zhigang Gao

 

Other publications of authors with the same name

"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs., , , and . IRPS, page 1-8. IEEE, (2020)An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants., , , , , , and . IEEE Access, (2020)Voltage step stress: a technique for reducing test time of device ageing., , , , and . ICICDT, page 1-4. IEEE, (2019)A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation., , , , , and . IRPS, page 75. IEEE, (2024)Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM., , , , , , and . IRPS, page 1-6. IEEE, (2024)Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs., , , , , , , and . IRPS, page 1-6. IEEE, (2020)ESD characterization of planar InGaAs devices., , , , , , , , , and 7 other author(s). IRPS, page 3. IEEE, (2015)Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED., , , , , , , , , and . IRPS, page 1-7. IEEE, (2024)Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs., , , , , , , and . IRPS, page 72. IEEE, (2024)Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications., , , , , and . IRPS, page 3. IEEE, (2022)