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Disambiguation of "Amrouch, Hussam"

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Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures.

, , , , and . VLSI-SoC, page 1-6. IEEE, (2021)

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Hussam Amrouch

Hussam Hamrawi

Hussam Haffar

Hussam Asi

Hussam Sheta

 

Other publications of authors with the same name

Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , and . IOLTS, page 68-71. IEEE, (2019)Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation., , , and . IRPS, page 1-6. IEEE, (2019)Impact of Radiation on Negative Capacitance FinFET., , , , , , and . IRPS, page 1-5. IEEE, (2020)Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture., , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (6): 2516-2528 (2022)On the Resiliency of NCFET Circuits Against Voltage Over-Scaling., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 68 (4): 1481-1492 (2021)Impact of NCFET on Neural Network Accelerators., , , , , and . IEEE Access, (2021)Unlocking Efficiency in BNNs: Global by Local Thresholding for Analog-Based HW Accelerators., , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 13 (4): 940-955 (December 2023)Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications., , , and . ICECS 2022, page 1-4. IEEE, (2022)Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness., , and . IRPS, page 1-4. IEEE, (2023)On Extracting Reliability Information from Speed Binning., , , and . ETS, page 1-4. IEEE, (2022)