Author of the publication

Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies.

, , , , , and . VLSI-SoC, page 78-83. IEEE, (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies., , , , , and . VLSI-SoC, page 78-83. IEEE, (2007)A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip., , , , , , , and . IEEE Trans. Computers, 57 (9): 1202-1215 (2008)Single event transients in combinatorial circuits., , , and . SBCCI, page 121-126. ACM, (2005)Generation and Propagation of Single Event Transients in CMOS Circuits., , , and . DDECS, page 198-203. IEEE Computer Society, (2006)Reducing TMR overhead by combining approximate circuit, transistor topology and input permutation approaches., and . SBCCI, page 1-6. IEEE, (2013)Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS Technologies., , , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-16. Springer, (2007)A multiple bit upset tolerant SRAM memory., , , and . ACM Trans. Design Autom. Electr. Syst., 8 (4): 577-590 (2003)Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity., , , , , , and . VLSI-SoC, page 1-6. IEEE, (2014)A Novel Phase-Based Low Overhead Fault Tolerance Approach for VLIW Processors., , , , , and . ISVLSI, page 485-490. IEEE Computer Society, (2015)Analyzing the effects of the granularity of recomputation based techniques to cope with radiation induced soft errors., , and . WREFT@CF, page 329-338. ACM, (2008)