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Efficient Transparency Extraction and Utilization in Hierarchical Test.

, , and . VTS, page 246-251. IEEE Computer Society, (2001)

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Hardware-Based Real-Time Workload Forensics., , and . IEEE Des. Test, 37 (4): 52-58 (2020)Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction., , , and . ETS, page 35-40. IEEE Computer Society, (2008)Secure Logic Locking with Strain-Protected Nanomagnet Logic., , , , , , , , , and 3 other author(s). DAC, page 127-132. IEEE, (2021)Cost-Driven Selection of Parity Trees., , and . VTS, page 319-324. IEEE Computer Society, (2004)A Statistical Approach to Characterizing and Testing Functionalized Nanowires., , , , and . VTS, page 267-274. IEEE Computer Society, (2008)Non-RF to RF Test Correlation Using Learning Machines: A Case Study., , , and . VTS, page 9-14. IEEE Computer Society, (2007)Proof carrying-based information flow tracking for data secrecy protection and hardware trust., and . VTS, page 252-257. IEEE Computer Society, (2012)Analog Performance Locking through Neural Network-Based Biasing., , , , , and . VTS, page 1-6. IEEE, (2019)Special session on machine learning: How will machine learning transform test?, , , and . VTS, page 1. IEEE Computer Society, (2018)A field programmable transistor array featuring single-cycle partial/full dynamic reconfiguration., , , , , and . DATE, page 1336-1341. IEEE, (2017)