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On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines., , , , and . VLSI-SoC, page 1-6. IEEE, (2021)Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects., , , , and . MECO, page 1-5. IEEE, (2020)On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques., , , , and . CoRR, (2020)Modeling Soft-Error Reliability Under Variability., , , , , and . DFT, page 1-6. IEEE, (2021)Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models., , , and . IOLTS, page 1-6. IEEE, (2020)Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits., , , , and . CoRR, (2020)Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis., , , , and . ISQED, page 24-30. IEEE, (2021)Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features., , , , and . IOLTS, page 1-7. IEEE, (2020)Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits., , , , and . IOLTS, page 7-14. IEEE, (2019)Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors., , , , and . AHS, page 72-78. IEEE, (2019)