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On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability., , , , , and . ICCD, page 506-509. IEEE, (2020)On the Effect of Aging on Digital Sensors., , , and . VLSID, page 189-194. IEEE, (2020)Detecting Failures and Attacks via Digital Sensors., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (7): 1315-1326 (2021)Real-Time IC Aging Prediction via On-Chip Sensors., , , and . ISVLSI, page 13-18. IEEE, (2021)Failure and Attack Detection by Digital Sensors., , , , and . ETS, page 1-2. IEEE, (2020)Masked SABL: A Long Lasting Side-Channel Protection Design Methodology., , , and . IEEE Access, (2021)Testing and Reliability Enhancement of Security Primitives., , , , , , , , and . DFT, page 1-8. IEEE, (2021)Reducing Aging Impacts in Digital Sensors via Run-Time Calibration., , , , and . J. Electron. Test., 37 (5): 653-673 (2021)On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits., , , and . ASP-DAC, page 414-420. ACM, (2021)Aging-Induced Failure Prognosis via Digital Sensors., , , , and . ACM Great Lakes Symposium on VLSI, page 703-708. ACM, (2023)