From post

Evaluation of Correlation Power Analysis Resistance and Its Application on Asymmetric Mask Protected Data Encryption Standard Hardware.

, , , , , , и . IEEE Trans. Instrum. Meas., 62 (10): 2716-2724 (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

A Side-channel Analysis Resistant Reconfigurable Cryptographic Coprocessor Supporting Multiple Block Cipher Algorithms., , , , , , , и . DAC, стр. 176:1-176:6. ACM, (2014)HTD: A light-weight holosymmetrical transition detector based in-situ timing monitoring technique for wide-voltage-range in 40nm CMOS., , , и . A-SSCC, стр. 209-212. IEEE, (2017)A 0.44V-1.1V 9-transistor transition-detector and half-path error detection technique for low power applications., , , , и . A-SSCC, стр. 205-208. IEEE, (2017)A 0.46V-1.1V Transition-Detector with In-Situ Timing-Error Detection and Correction Based on Pulsed-Latch Design in AES Accelerator., , , , , , и . A-SSCC, стр. 1-4. IEEE, (2018)A Depthwise Separable Convolution Neural Network for Small-footprint Keyword Spotting Using Approximate MAC Unit and Streaming Convolution Reuse., , и . APCCAS, стр. 309-312. IEEE, (2019)VLSI design of a reconfigurable S-box based on memory sharing method., , , и . IEICE Electron. Express, 11 (1): 20130872 (2014)IVATS: A Leakage Reduction Technique Based on Input Vector Analysis and Transistor Stacking in CMOS Circuits., , и . ISCAS, стр. 1-5. IEEE, (2023)An Efficient and Reliable Negative Margin Timing Error Detection for Neural Network Accelerator without Accuracy Loss in 28nm CMOS., , , , и . A-SSCC, стр. 1-3. IEEE, (2021)Short-path Padding Method for Timing Error Resilient Circuits based on Transmission Gates Insertion., , и . ACM Great Lakes Symposium on VLSI, стр. 105-110. ACM, (2018)Using Wind Turbines for Providing Defined Levels of Synthetic Inertia in System Split Scenarios., , и . ISGT-Europe, стр. 829-833. IEEE, (2020)