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A synthesis and optimization procedure for fully and easily testable sequential machines., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 8 (10): 1100-1107 (1989)System-level design: orthogonalization of concerns andplatform-based design., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (12): 1523-1543 (2000)Decomposition and factorization of sequential finite state machines., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 8 (11): 1206-1217 (1989)WELD - An Environment for Web-based Electronic Design., , и . DAC, стр. 146-151. ACM Press, (1998)Critic: a knowledge-based program for critiquing circuit designs., и . ICCD, стр. 324-327. IEEE, (1988)From ASIC to ASIP: The Next Design Discontinuity., , и . ICCD, стр. 84-90. IEEE Computer Society, (2002)On the Verification of Sequential Machines at Differing Levels of Abstraction., , и . DAC, стр. 271-276. IEEE Computer Society Press / ACM, (1987)Experiments on the synthesis and testability of non-scan finite state machines., , и . EURO-DAC, стр. 537-542. IEEE Computer Society Press, (1992)Highlights of VLSI Research at Berkeley., , и . FJCC, стр. 894-897. IEEE Computer Society, (1986)Digital Image Restoration by Exposure-Splitting and Registration., , и . ICPR (4), стр. 657-660. IEEE Computer Society, (2004)