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IR-drop management CAD techniques in FPGAs for power grid reliability.

, and . ISQED, page 746-752. IEEE Computer Society, (2009)

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Variability-aware design of subthreshold devices., , and . ISCAS, page 1196-1199. IEEE, (2008)On Efficient LHS-Based Yield Analysis of Analog Circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (1): 159-163 (2011)Variability-Aware Bulk-MOS Device Design., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (2): 205-216 (2008)A robust single supply voltage SRAM read assist technique using selective precharge., , and . ESSCIRC, page 234-237. IEEE, (2008)IR-drop management CAD techniques in FPGAs for power grid reliability., and . ISQED, page 746-752. IEEE Computer Society, (2009)Adaptive sampling for efficient failure probability analysis of SRAM cells., and . ICCAD, page 623-630. ACM, (2009)A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations., , , , , , , and . ICEAC, page 1-6. IEEE, (2011)Practical Monte-Carlo based timing yield estimation of digital circuits., and . DATE, page 807-812. IEEE Computer Society, (2010)Variability-aware device optimization under ION and leakage current constraints., and . ISLPED, page 119-122. ACM, (2006)Floorplanning for low power IC design considering temperature variations., , and . Microelectron. J., 42 (1): 89-95 (2011)