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Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic Temperatures.

, , , , , и . ESSDERC, стр. 246-249. IEEE, (2018)

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Edoardo Costadura

Edoardo Mirabella

Edoardo Costadura

Edoardo Pignotti

Edoardo Sassone

 

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