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A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats.

, and . IEEE Instrum. Meas. Mag., 23 (5): 27-32 (2020)

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Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip., , , , , and . ITC, page 1-10. IEEE Computer Society, (2007)Future Trends in Test: The Adoption and Use of Low Cost Structural Testers.. ITC, page 698-703. IEEE Computer Society, (2004)Innovate Practices on CyberSecurity of Hardware Semiconductor Devices., , , , , , , , , and 4 other author(s). VTS, page 1. IEEE, (2019)Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution., , and . ITC, page 660-669. IEEE Computer Society, (1994)The testability features of the 3rd generation ColdFire family of microprocessors., , , , and . ITC, page 913-922. IEEE Computer Society, (1999)Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox., , , , , and . ITC, page 1-10. IEEE Computer Society, (2012)Optimization trade-offs for vector volume and test power., and . ITC, page 873-881. IEEE Computer Society, (2000)BA-BIST: Board test from inside the IC out., and . ITC, page 1. IEEE Computer Society, (2013)Processing High Volume Scan Test Results for Yield Learning., , and . ISQED, page 293-298. IEEE Computer Society, (2007)Detecting a trojan die in 3D stacked integrated circuits., , , , , and . NATW, page 1-6. IEEE, (2017)