Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Kelvin Bridge Structure Based TSV Test for Weak Faults.

C. Hao, Z. Huang, and T. Ni. ITC-Asia, page 1-6. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ying Ni

Pedestrian safety at urban signalised intersectionsY. Ni. TU Darmstadt, (2009)

Yi Ni

Ji Ni

Xiaoju Ni

Shaoji Ni

Other publications of authors with the same name

Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator.J. Cui, M. Yi, D. Cao, L. Yao, X. Wang, H. Liang, Z. Huang, H. Qi, T. Ni, and Y. Lu. IEEE Trans. Circuits Syst. II Express Briefs, 69 (3): 1752-1756 (2022)Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure.Q. Xu, H. Geng, T. Ni, S. Chen, B. Yu, Y. Kang, and X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3182-3187 (2022)A novel in-field TSV repair method for latent faults.T. Ni, H. Chang, H. Qi, and Z. Huang. IEICE Electron. Express, 15 (23): 20180873 (2018)LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults.T. Ni, Y. Yao, H. Chang, L. Lu, H. Liang, A. Yan, Z. Huang, and X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (10): 2938-2951 (2020)SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments.A. Yan, Z. Li, S. Huang, Z. Zhai, X. Cheng, J. Cui, T. Ni, X. Wen, and P. Girard. DATE, page 1257-1262. IEEE, (2022)A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch.A. Yan, K. Qian, J. Cui, N. Cui, T. Ni, Z. Huang, and X. Wen. NANOARCH, page 1-6. IEEE, (2021)MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator.T. Ni, Q. Peng, J. Bian, L. Yao, Z. Huang, A. Yan, and X. Wen. AsianHOST, page 1-6. IEEE, (2022)A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments.A. Yan, A. Cao, Z. Fan, Z. Xu, T. Ni, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 301-306. ACM, (2021)A Hybrid DMR Latch to Tolerate MNU Using TDICE and WDICE.Z. Huang, Y. Zhang, Z. Su, H. Liang, H. Yao, and T. Ni. ATS, page 121-126. IEEE, (2018)A SEU Immune Flip-Flop with Low Overhead.Z. Huang, X. Li, S. Pan, M. Wang, and T. Ni. ML4CS (2), volume 12487 of Lecture Notes in Computer Science, page 56-65. Springer, (2020)

BibSonomy

Disambiguation of "Ni, Tianming"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Kelvin Bridge Structure Based TSV Test for Weak Faults.

Please choose a person to relate this publication to

Ying Ni

Yi Ni

Ji Ni

Xiaoju Ni

Shaoji Ni

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Ni, Tianming"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Kelvin Bridge Structure Based TSV Test for Weak Faults.

Please choose a person to relate this publication to

Ying Ni

Yi Ni

Ji Ni

Xiaoju Ni

Shaoji Ni

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Kelvin Bridge Structure Based TSV Test for Weak Faults.