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Disambiguation of "Marinissen, Erik Jan"

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Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions.

, , , , , and . ITC, page 143-152. IEEE, (2021)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Jan-Erik Schmutz

Adhäsions- und Abriebuntersuchungen mittels rasterkraftmikroskopischer Techniken auf der Mikro- und Nanoskala. Uni Münster, (2009)

Nilgün Erikli

Anders Erikson

Jan Erik Spitzley

Jan Erik Eickbohm

 

Other publications of authors with the same name

An Industrial Approach to Core-Based System Chip Testing.. VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 389-400. Kluwer, (2001)How Useful are the ITC 02 SoC Test Benchmarks?, and . IEEE Des. Test Comput., 19 (5): 120, 119 (2002)SOC test architecture design for efficient utilization of test bandwidth., and . ACM Trans. Design Autom. Electr. Syst., 8 (4): 399-429 (2003)Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis., and . IEEE Des. Test Comput., 25 (3): 206-207 (2008)Conference Reports., , , , , and . IEEE Des. Test Comput., 23 (4): 262-265 (2006)Device-Aware Test for Back-Hopping Defects in STT-MRAMs., , , , , , , , and . DATE, page 1-6. IEEE, (2023)Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs., , , , , and . ITC, page 1-10. IEEE, (2020)On Scan Chain Diagnosis for Intermittent Faults., , , and . Asian Test Symposium, page 47-54. IEEE Computer Society, (2009)IEEE Std 1500 Compliant Infrastructure forModular SOC Testing., , and . Asian Test Symposium, page 450. IEEE Computer Society, (2005)Automation of 3D-DfT Insertion., , , , , , and . Asian Test Symposium, page 395-400. IEEE Computer Society, (2011)