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Hierarchical characterization procedures for dimensional metrology.

, , , and . Three-Dimensional Imaging, Interaction, and Measurement, volume 7864 of SPIE Proceedings, page 786402. SPIE, (2011)

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Hierarchical characterization procedures for dimensional metrology., , , and . Three-Dimensional Imaging, Interaction, and Measurement, volume 7864 of SPIE Proceedings, page 786402. SPIE, (2011)Proposed NRC portable target case for short-range triangulation-based 3D imaging systems characterization., , , and . Three-Dimensional Imaging, Interaction, and Measurement, volume 7864 of SPIE Proceedings, page 78640L. SPIE, (2011)