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Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters.

, , , and . VTS, page 1-6. IEEE Computer Society, (2013)

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Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models., , , , and . DAC, page 668-673. ACM, (2003)Design considerations and DFT to enable testing of digital interfaces., , and . CICC, page 197-205. IEEE, (2004)Interposer test: Testing PCBs that have shrunk 100x.. ITC, page 1. IEEE Computer Society, (2014)Logic soft errors: a major barrier to robust platform design., , , , , and . ITC, page 10. IEEE Computer Society, (2005)Limitation of structural scan delay test.. Asian Test Symposium, page 471. IEEE Computer Society, (2005)Does It Mean Less Testing for Self Calibrating Design?.. IOLTS, page 99. IEEE Computer Society, (2005)Test Challenges for 3D Circuits.. IOLTS, page 79. IEEE Computer Society, (2006)A path-based methodology for post-silicon timing validation., , , and . ICCAD, page 713-720. IEEE Computer Society / ACM, (2004)Sequential Element Design With Built-In Soft Error Resilience., , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 14 (12): 1368-1378 (2006)An industrial case study for X-canceling MISR., , , and . ITC, page 1-10. IEEE Computer Society, (2009)