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An eDRAM-Based Computing-in-Memory Macro With Full-Valid-Storage and Channel-Wise-Parallelism for Depthwise Neural Network.

X. Qiao, Y. Yang, C. Xue, Y. He, X. Cui, S. Jia, и Y. Wang. IEEE Trans. Circuits Syst. II Express Briefs, 71 (5): 2539-2543 (мая 2024)

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Xue Xue Zhang

Jia Xue

Cheng Xue

Min Xue

Yida Xue

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Single-Mode CMOS 6T-SRAM Macros With Keeper-Loading-Free Peripherals and Row-Separate Dynamic Body Bias Achieving 2.53fW/bit Leakage for AIoT Sensing Platforms.Y. Zhang, C. Xue, X. Wang, T. Liu, J. Gao, P. Chen, J. Liu, L. Sun, L. Shen, J. Ru и 2 other автор(ы). ISSCC, стр. 184-186. IEEE, (2022)Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET.C. Xue, Y. Zhang, P. Chen, M. Zhu, T. Wu, M. Wu, Y. He, и L. Ye. ISCAS, стр. 595-599. IEEE, (2022)A Dual-Branch Autoencoder Network for Underwater Low-Light Polarized Image Enhancement.C. Xue, Q. Liu, Y. Huang, E. Cheng, и F. Yuan. Remote. Sens., 16 (7): 1134 (апреля 2024)An eDRAM-Based Computing-in-Memory Macro With Full-Valid-Storage and Channel-Wise-Parallelism for Depthwise Neural Network.X. Qiao, Y. Yang, C. Xue, Y. He, X. Cui, S. Jia, и Y. Wang. IEEE Trans. Circuits Syst. II Express Briefs, 71 (5): 2539-2543 (мая 2024)A 768.7-2124.2 TOPS/W Time-Domain Computing-in-Memory Macro With Low Static Leakage and Precision-Configurable TDC.C. Xue, X. Qiao, X. Ren, G. Du, Y. Wang, и Y. He. IEEE Trans. Circuits Syst. II Express Briefs, 71 (5): 2789-2793 (мая 2024)Robust Bearing-Only Localization Using Total Least Absolute Residuals Optimization.J. Luo, C. Xue, и D. Peng. Complex., (2020)Digitizing uncertainty modeling for reverse engineering applications: regression versus neural networks.C. Feng, и X. Wang. J. Intell. Manuf., 13 (3): 189-199 (2002)Short-Term Capacity Adjustment with Offline Production for a Flexible Manufacturing System under Abnormal Disturbances.R. deMatta, V. Hsu, и C. Feng. Ann. Oper. Res., 107 (1-4): 83-100 (2001)Mapreduce-Apriori algorithm under cloud computing environment.X. Chang. ICMLC, стр. 637-641. IEEE, (2015)

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