From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Impact of NCFET on Neural Network Accelerators., , , , , и . IEEE Access, (2021)Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture., , , , , и . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (6): 2516-2528 (2022)On the Resiliency of NCFET Circuits Against Voltage Over-Scaling., , , , , , , и . IEEE Trans. Circuits Syst. I Regul. Pap., 68 (4): 1481-1492 (2021)Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness., , и . IRPS, стр. 1-4. IEEE, (2023)On Extracting Reliability Information from Speed Binning., , , и . ETS, стр. 1-4. IEEE, (2022)Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications., , , и . ICECS 2022, стр. 1-4. IEEE, (2022)Unlocking Efficiency in BNNs: Global by Local Thresholding for Analog-Based HW Accelerators., , , , и . IEEE J. Emerg. Sel. Topics Circuits Syst., 13 (4): 940-955 (декабря 2023)Security Closure of Physical Layouts ICCAD Special Session Paper., , , , , , , , и . ICCAD, стр. 1-9. IEEE, (2021)ICCAD Tutorial Session Paper Ferroelectric FET Technology and Applications: From Devices to Systems., , , , , , , , , и 1 other автор(ы). ICCAD, стр. 1-8. IEEE, (2021)ML-TCAD: Perspectives and Challenges on Accelerating Transistor Modeling using ML., , и . MLCAD, стр. 1-4. IEEE, (2023)