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Disambiguation of "Majhi, Ananta K."

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Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects.

, , , , and . ITC, page 1-10. IEEE Computer Society, (2007)

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Paresh Kumar Majhi

Ananta Paine

Ananta Tiwari

Edwin Ananta

Taik Ananta Narayan

 

Other publications of authors with the same name

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (5): 809-813 (2012)Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)Memory testing improvements through different stress conditions., , , , , and . ESSCIRC, page 299-302. IEEE, (2005)Efficient Grouping of Fail Chips for Volume Yield Diagnostics., , , and . VLSI Design, page 97-102. IEEE Computer Society, (2009)Memory Testing Under Different Stress Conditions: An Industrial Evaluation., , , , , and . DATE, page 438-443. IEEE Computer Society, (2005)Mixed-Signal Test., and . VLSI Design, page 285-288. IEEE Computer Society, (1998)Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model., , , , , and . VTS, page 345-350. IEEE Computer Society, (2003)Impact of Temperature on Test Quality., , , , , and . VLSI Design, page 276-281. IEEE Computer Society, (2010)On test coverage of path delay faults., , , and . VLSI Design, page 418-421. IEEE Computer Society, (1996)Automated AC (Timing) Characterization for Digital Circuit Testing., and . VLSI Design, page 374-377. IEEE Computer Society, (1998)