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Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection.

, , , and . IEEE Trans. Syst. Man Cybern. Part C, 39 (3): 352-365 (2009)

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Using a self-organizing neural network for wafer defect inspection., , and . SMC (5), page 4312-4317. IEEE, (2004)Normalized In-Line Stepper Coordinator Design by the Sequence Diagram and Production Rules: A Case Study., and . ICRA, page 3169-3174. IEEE, (2002)An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection., , and . ICRA, page 3000-3005. IEEE, (2005)Modeling and analysis of traffic light controller using Statechart., , and . SMC, page 557-562. IEEE, (2010)Enhancement of an deadlock prevention policy for FMSs using theory of regions., , , and . SMC, page 304-309. IEEE, (2010)A polynomial algorithm for checking diagnosability of Petri nets., , and . SMC, page 2542-2547. IEEE, (2005)Modeling a discrete event system using statecharts, , and . 2, page 1093--1098. (2004)An Agent-Based Early Manufacturability Assessment for Collaborative Design in Coating Process., , , and . KES (2), volume 4693 of Lecture Notes in Computer Science, page 649-655. Springer, (2007)Computationally Improved Optimal Control Methodology for Linear Programming Problems of Flexible Manufacturing Systems., , , , and . J. Appl. Math., (2013)Diagnosability Enhancement of Discrete Event Systems., , and . SMC, page 4096-4101. IEEE, (2006)